Semiconductor strain sensor and manufacturing method thereof

Measuring and testing – Speed – velocity – or acceleration – Acceleration determination utilizing inertial element

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G01P 1508

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active

051506165

ABSTRACT:
A semiconductor strain sensor having a stem with a lead hole in which a lead terminal is installed and electrically coupled to an external circuit. A sensor chip having piezo-resistors to a bride circuit is joined with a front surface of the stem. A shell is joined with the front surface of the stem by projection welding after the back surface of the stem is flattened to within a predetermined limit. A space formed by the shell and stem is filled with a damping liquid. The stem is integrally coupled to the sensor chip through an adhesive, and spacers are added to the adhesive to keep the thickness of the adhesive to a predetermined value. This arrangement can effectively prevent propagation of the welding strain of the stem from adversely affecting the sensor chip.

REFERENCES:
patent: 3609624 (1971-09-01), Nagy
patent: 3923581 (1975-12-01), Payne et al.
patent: 4829822 (1989-05-01), Imai et al.
patent: 4967605 (1990-11-01), Okada
patent: 4987781 (1991-01-01), Reimann
"A Batch--Fabricated Silicon Accelerometer" by L. M. Roylance et al; IEEE Transactions on Electron Devices, vol. ED-26, No. 12, Dec. 1979.
Journal of Nippondenso Technical Disclosure by Tsuzuki; Mar. 15, 1987.

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