Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Patent
1989-02-13
1990-03-27
Raevis, Robert R.
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
Specified electrical sensor or system
73708, G01L 100
Patent
active
049110160
ABSTRACT:
A semiconductor strain gauge bridge circuit device is disclosed to include a bridge circuit of semiconductor strain gauges, a first zero-point temperature compensation circuit connected to one of a pair of output terminals of the bridge circuit and including a voltage-dividing resistor circuit generating a voltage substantially equal to a potential appearing at the one output terminal at a predetermined temperature, and a second zero-point temperature compensation circuit connected to the other of the output terminals and including a resistive element having a temperature characteristic similar to that of the semiconductor strain gauges.
REFERENCES:
patent: 3717038 (1973-02-01), Plett et al.
patent: 3967188 (1976-06-01), Spencer
patent: 4173148 (1979-11-01), Yamada et al.
patent: 4414853 (1983-11-01), Bryzek
patent: 4463274 (1984-07-01), Swartz
patent: 4480478 (1984-11-01), Sato et al.
patent: 4510813 (1985-04-01), Kanazawa
Kobayashi Ryoichi
Miyazaki Atsushi
Hitachi , Ltd.
Raevis Robert R.
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