Optics: measuring and testing – By light interference – Rotation rate
Reexamination Certificate
2005-10-26
2010-02-16
Lee, Hwa S. A (Department: 2886)
Optics: measuring and testing
By light interference
Rotation rate
C356S460000
Reexamination Certificate
active
07663763
ABSTRACT:
A laser gyro includes a semiconductor medium and assembled discrete elements, thus offering the possibility of producing large cavities for achieving the desired precision. More precisely, the laser gyro includes an optical ring cavity and a semiconductor amplifying medium with an external cavity having a vertical structure. The semiconductor amplifying medium which is used in reflection includes a stack of plane gain regions that are mutually parallel, and the dimensions of the cavity being substantially are larger than those of the amplifying medium.
REFERENCES:
patent: 4405236 (1983-09-01), Mitsuhashi et al.
patent: 4431308 (1984-02-01), Mitsuhashi et al.
patent: 5960022 (1999-09-01), Halldorsson et al.
patent: 2004/0202222 (2004-10-01), Pocholle et al.
patent: 02/097370 (2002-12-01), None
patent: WO 02/097370 (2002-12-01), None
Feugnet Gilles
Pocholle Jean-Paul
Schwartz Sylvain
A Lee Hwa S.
Lowe Hauptman & Ham & Berner, LLP
Thales
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