Measuring and testing – Instrument proving or calibrating – Span or set point adjustment
Patent
1996-10-11
1998-12-29
Noland, Thomas P.
Measuring and testing
Instrument proving or calibrating
Span or set point adjustment
7351433, 73721, G01L 906, G01L 2700, G01P 1512, G01P 2100
Patent
active
058544216
ABSTRACT:
A semiconductor sensor having a semiconductor sensor chip with a diaphragm on which a bridge circuit is formed with piezoresistances has a resistor for adjusting an offset of the bridge circuit wherein an adjustment is done to equalize an output voltage of the sensor at the upper operating limit temperature to that at the lower operating limit temperature by trimming the resistor.
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Mitsubishi Denki & Kabushiki Kaisha
Noland Thomas P.
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