Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Responsive to non-optical – non-electrical signal
Reexamination Certificate
2006-08-22
2006-08-22
Dickey, Thomas L. (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Responsive to non-optical, non-electrical signal
C257S415000, C073S204260
Reexamination Certificate
active
07095064
ABSTRACT:
In a semiconductor sensor having a membrane structure, the destruction of the membrane caused by the expansion or contraction of a fluid within a hollow part formed under the membrane while the sensor is in use is prevented. A semiconductor sensor10comprising a substrate30and a membrane20formed on the top surface thereof, in which the bottom of the substrate30and a mounting surface50on which the sensor10is mounted are bonded, has pressure difference adjusting means22ato22cfor eliminating the difference in pressure of a fluid between an inside and an outside of a hollow part34while the sensor is in use.
REFERENCES:
patent: 5581028 (1996-12-01), Barth et al.
patent: 6150681 (2000-11-01), Allen
patent: A S59-137835 (1984-08-01), None
patent: A-H06-129898 (1994-05-01), None
patent: A-H07-58134 (1995-03-01), None
patent: A-H07-120306 (1995-05-01), None
Denso Corporation
Dickey Thomas L.
Posz Law Group , PLC
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