Measuring and testing – Speed – velocity – or acceleration – Acceleration determination utilizing inertial element
Patent
1992-12-23
1994-05-24
Chapman, John E.
Measuring and testing
Speed, velocity, or acceleration
Acceleration determination utilizing inertial element
73514, G01P 1508
Patent
active
053138368
ABSTRACT:
A semiconductor sensor for an accelerometer including a beam portion, consisting of a thin beam portion and a thick beam portion and supported by a solid member through the end of the thin beam portion, and a stopper portion provided at a position on an imaginary line along which a center of gravity of the thick beam portion moves. These components are integrally formed in a silicon substrate. Excessive displacement of the beam portion when excessive acceleration is applied is effectively suppressed by the stopper portion, and breakage of the thin beam portion due to excessive acceleration can be avoided.
REFERENCES:
patent: 4882933 (1989-11-01), Petersen et al.
patent: 4955234 (1990-09-01), Marek
Proceedings of the Second International Forum on ASIC and Transducer Technology (ASICT '89) Apr. 9-12, 1989, Mallon et al., "Silicon Sensors and Microstructures: Technology of Today," pp. 87-92.
Fujii Tetsuo
Gotoh Yoshitaka
Kuroyanagi Susumu
Chapman John E.
Nippondenso Co. Ltd.
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