Semiconductor sensor device having a correction circuit

Details Semiconductor sensor device having a correction circuit Semiconductor sensor device having a correction circuit

2011-05-24

2011-05-24

Thomas, Tom (Department: 2893)

Television

Camera, system and detail

Combined image signal generator and general image signal...

C257S072000, C257SE31085, C348S294000

Reexamination Certificate

active

07948530

ABSTRACT:
An imaging device includes a read circuit having a bias circuit for biasing the signal currents output from a sensor array to correct variations of the sensor array. The bias current is determined so that the number of pixel data output from the read circuit which are below or above the threshold is equal to a specified number setting for the number of pixel data. A fixed pattern noise (FPN) correction circuit determines the full scale of the FPN correction current based on the bias current.

REFERENCES:
patent: 5625210 (1997-04-01), Lee et al.
patent: 6061093 (2000-05-01), Yonemoto
patent: 6441411 (2002-08-01), Nozaki et al.
patent: 9-284651 (1997-10-01), None
patent: 10-304251 (1998-11-01), None
patent: 11-150683 (1999-06-01), None
patent: 2000-106651 (2000-04-01), None
patent: 2000-165748 (2000-06-01), None
IEEE Technical Report , ED98-265, pp. 9-16 by Tanaka et al.

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