Semiconductor protection device

Active solid-state devices (e.g. – transistors – solid-state diode – Bipolar transistor structure – Plural non-isolated transistor structures in same structure

Reexamination Certificate

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Details

C257S567000, C257S568000, C257S200000

Reexamination Certificate

active

07045877

ABSTRACT:
The invention is directed to improve resistance to destruction of a semiconductor device. A protection circuit having a plurality of bipolar transistors which are Darlington connected between outputs (collector and emitter) of an amplification circuit of a high output is electrically connected in parallel with the amplification circuit. The amplification circuit has a plurality of unit HBTs (Heterojunction Bipolar Transistors) which are connected in parallel with each other. The protection circuit has a two-stage configuration including a first group of a protection circuit having a plurality of bipolar transistors Q1to Q5and a second group of a protection circuit having a plurality of bipolar transistors.

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patent: 6426855 (2002-07-01), Lee et al.
patent: 6469353 (2002-10-01), Amerasekera et al.
patent: 2005/0122644 (2005-06-01), Ma et al.
patent: 2000-315693 (2000-11-01), None
patent: 2001-44214 (2001-02-01), None
patent: WO 01/18865 (2001-03-01), None
K. Joshin et al., “Harmonic Feedback Circuit Effects on Intermodulation Products and Adjacent Channel Leakage Power in HBT Power Amplifier for 1.95 GHz Wide-Band CDMA Cellular Phones”, IEICE Trans. Electron., vol. E82-C, No. 5, May 1999, pp. 725-729.

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