Measuring and testing – Miscellaneous
Patent
1976-03-11
1977-10-25
Queisser, Richard C.
Measuring and testing
Miscellaneous
73 28, 73432PS, 73DIG11, G01L 114
Patent
active
040550893
ABSTRACT:
A semiconductor projectile impact detector for use in determining micrometeorite presence as well as its flux and energy comprises a photovoltaic cell which generates a voltage according to the light and heat emitted by the micrometeorites upon impact with the cell. A counter and peak amplitude measuring device are used to indicate the number of particules which strike the surface of the cell as well as the kinetic energy of each of the particles.
REFERENCES:
patent: 2944250 (1960-07-01), Putt
patent: 3307407 (1967-03-01), Berg et al.
patent: 3407304 (1968-10-01), Kinard et al.
patent: 3587291 (1971-06-01), Escullier et al.
patent: 3805591 (1974-04-01), Willis et al.
Gorenstein Charles
Manning J. R.
Porter George J.
Queisser Richard C.
The United States of America as represented by the Administrator
LandOfFree
Semiconductor projectile impact detector does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor projectile impact detector, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor projectile impact detector will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-118099