Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1997-12-15
2000-07-18
Font, Frank G.
Optics: measuring and testing
By polarized light examination
With light attenuation
2505593, G01B 1114, G01N 2100
Patent
active
06091498&
ABSTRACT:
A lift/tilt assembly for use in a semiconductor wafer processing device is set forth. The lift/tilt assembly includes a linear guide/actuator comprising a fixed frame and a movable frame. A nest for accepting a plurality of semiconductor wafers is rotatably connected to the movable frame. The nest rotates between a wafer-horizontal orientation and a wafer-vertical orientation as it is driven with the movable frame by a motor that is coupled to the linear way. A lever connected to the nest provides an offset from true vertical for the nest when the nest is in the wafer-vertical orientation.
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Dix Mark
Hanson Kyle
Woodruff Daniel J.
Zila Vladimir
Font Frank G.
Semitool Inc.
Stafira Michael P.
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