Coating apparatus – Gas or vapor deposition – With treating means
Patent
1995-08-21
1997-03-18
Breneman, R. Bruce
Coating apparatus
Gas or vapor deposition
With treating means
118723MR, 118723E, C23C 1600
Patent
active
056118635
ABSTRACT:
An ECR plasma CVD apparatus includes a plasma generation chamber to which a microwave and a plasma source gas are introduced. An excitation solenoid is arranged around the plasma generation chamber to form an electron cyclotron resonance magnetic field with the microwave in the plasma generation chamber. A plasma reaction chamber to which a reactive gas is introduced is provided in communication with the plasma generation chamber. A substrate holder for holding a silicon wafer is set in the plasma reaction chamber. A leakage-type butterfly valve whose opening degree can be freely controlled is arranged in communication with the plasma reaction chamber. A turbo molecular pump is formed in the outlet of the butterfly valve. A subpump is arranged in the outlet of the turbo molecular pump.
REFERENCES:
patent: 4816113 (1989-03-01), Yamazaki
patent: 4971667 (1990-11-01), Yamazaki et al.
patent: 5368685 (1994-11-01), Kumihashi et al.
patent: 5512102 (1996-04-01), Yamazaki
Breneman R. Bruce
Chang Joni Y.
Tokyo Electron Limited
Tokyo Electron Tohoku Limited
LandOfFree
Semiconductor processing apparatus and cleaning method thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor processing apparatus and cleaning method thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor processing apparatus and cleaning method thereof will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1702978