Semiconductor process using selective deposition

Fishing – trapping – and vermin destroying

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437193, 437 34, 148DIG105, H01L 21265

Patent

active

050700294

ABSTRACT:
A process for fabricating semiconductor devices is disclosed which utilizes a selective deposition process to reduce the total number of process steps and especially the total number of photolithography steps required. In accordance with one embodiment of the invention a semiconductor substrate is provided having an insulating layer, a nucleating layer, and a second insulating layer overlaying the substrate. A photoresist mask is used as an implant mask and as an etch mask to expose a portion of nucleating layer. A second implant mask is formed by the selective deposition of tungsten or other material on the exposed nucleating layer. The selectively deposited material is then used to mask for a second ion implantation.

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patent: 4822749 (1989-04-01), Flanner et al.
patent: 4874713 (1989-10-01), Gioia
patent: 4948745 (1990-08-01), Pfiester et al.

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