Measuring and testing – Fluid pressure gauge – With pressure and/or temperature compensation
Patent
1979-10-25
1981-11-17
Woodiel, Donald O.
Measuring and testing
Fluid pressure gauge
With pressure and/or temperature compensation
73727, 338 4, 338 7, 338 42, G01L 1904
Patent
active
043003958
ABSTRACT:
A semiconductor pressure detection device is provided which is adapted to detect pressure using resistors formed in the surface area of a semiconductor substrate and having a piezo-effect. A diode is formed in the surface area of the semiconductor substrate and a drive voltage corresponding to a temperature variation is supplied to a bridge circuit through the diode.
REFERENCES:
patent: 3836796 (1974-09-01), Solomon et al.
patent: 4202218 (1980-05-01), Romo
Honeywell Report, "The Diffused Silicon Approach to Differential Pressure Measurement", by John A. Weaver, pp. 103-110.
Noda Ryuzo
Shirouzu Shunji
Tokyo Shibaura Denki Kabushiki Kaisha
Woodiel Donald O.
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