Semiconductor pick-and-place machine automatic calibration appar

Details Semiconductor pick-and-place machine automatic calibration appar Semiconductor pick-and-place machine automatic calibration appar

1991-12-04

1993-08-17

Mancuso, Joseph

Image analysis

Histogram processing

For setting a threshold

358101, 382 48, G06K 900

Patent

active

052376222

ABSTRACT:
An apparatus and method of automatically performing a calibration of the accuracy of placement of semiconductor chips or devices by a pick-and-place machine. The parts are placed on an adhesive-backed glass plate that has calibrated black marks whose dimensions match those of a specific part lead footprint. A gray scale camera mounted on the machine above the inverted glass plate records and sends a signal to a machine computer identifying the coordinates of exposed part silver lead area. The computer calculates part placement error and sends error data to a CRT or camera screen and alarm to alert an operator.

REFERENCES:
patent: 4953100 (1990-08-01), Yotsuya
patent: 4973852 (1990-11-01), Denkevitz
patent: 4989082 (1991-01-01), Hopkins
patent: 5027418 (1991-06-01), Ikegaya et al.
patent: 5134575 (1992-07-01), Takagi
patent: 5140643 (1992-08-01), Izumi et al.

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