Semiconductor packages and methods for making the same

Details Semiconductor packages and methods for making the same Semiconductor packages and methods for making the same

2001-10-04

2004-08-24

Nguyen, Tuyen T. (Department: 2832)

Metal working

Method of mechanical manufacture

Electrical device making

C174S255000, C257S666000

Reexamination Certificate

active

06779258

ABSTRACT:

FIELD OF THE INVENTION
This invention relates generally to semiconductor packages and more specifically to semiconductor package support elements having one or more covered reject die sites and methods for making semiconductor packages from the same.
BACKGROUND OF THE INVENTION
In semiconductor manufacture, a single semiconductor die (or chip) can be packaged within a sealed package. The package protects the die from damage and from contaminants in the surrounding environment. In addition, the package provides a substantial lead system for electrically connecting the integrated circuits on the die to the outside world.
One type of semiconductor package
10
is illustrated in FIG.
1
A. The package
10
includes a substrate
12
having a planar die attach surface or die site
22
. A semiconductor die
16
is mounted to an upper surface of the substrate
12
on the die site
22
. The die
16
is typically adhesively bonded to the substrate
12
with an adhesive layer
34
. An encapsulating resin
38
encapsulates the die
16
.
In addition to the die site
22
on the upper surface, the substrate
12
includes an opposing conductor surface
24
wherein conductors
18
are formed in a required pattern. A wire bond opening
26
in the substrate
12
provides access for bonding wires
28
. The bonding wires
28
are connected to the conductors
18
and to bond pads (not shown) on the die
16
. A glob top
40
is formed over the wires
28
for protection.
The semiconductor package
10
also includes an array of solder balls
14
. The solder balls
14
are bonded to ball bonding pads
24
on the conductors
18
.
As shown in
FIG. 1B
, the substrate
12
is initially a segment
32
of a support element
30
. The support element
30
includes multiple substrates
12
(and thus multiple die sites
22
). The support element is used to fabricate multiple semiconductor packages
10
. The support element facilitates the fabrication process in that different operations, such as die attach and wire bonding, can be performed at the same time on each of the substrates. Following the fabrication of the semiconductor packages
10
from the support element
30
, the support element is singulated into individual semiconductor packages.
The process for packaging semiconductor dice includes matching a die to each die site on the support element. The die is attached to the die site over the wire bond opening
26
so that the die may be electrically connected to the substrate. Currently available support elements typically include one or more substrates that are defective or non-functional, i.e., the substrates include “reject die sites.” Individual substrates of a support element may be non-functional for a variety of reasons, such as faulty electrical circuitry of a substrate. Such defect substrates of the support element cannot be utilized to fabricate a functional semiconductor package but cannot be separated from the support element prior to processing of the other substrates on the support element. If the defective substrates are separated from the support element, such action necessarily limits the number of substrates that may be processed at one time using the separated support element. Thus, physical separation of defect substrates from the support element prior to fabrication of the semiconductor packages is not preferred.
When functional dice are attached to the “reject die sites” of the support element and further are processed, the resulting semiconductor packages are necessarily defective. This sacrifices functional dice, thereby increasing semiconductor package manufacturing costs and decreasing yields. To avoid the added cost (i.e., sacrificing functional dice), a “reject die site” on a support element could simply be skipped or omitted during the die attach process. Regrettably, omitting attachment of a die to a die site on a support element causes problems during the encapsulation process.
During the encapsulation process, liquid encapsulation material flows over and around the attached dice and substrates of the support element. If one or more bonding slots are left open, i.e., a die is not attached to a die site of the support element, the encapsulation material flows through the uncovered opening
26
. When the encapsulation material flows through such openings, it contaminates dice adjacent and/or near the uncovered opening. This is known as “bleeding or flashing.” The bleeding of encapsulation material produces even more defective semiconductor packages, further increasing manufacturing costs and lowering yield. Moreover, bleeding of the encapsulation material may stick to the mold body and contaminate the next support element processed through the encapsulation machine.
In attempt to avoid (1) sacrificing functional dice by attaching the dice on reject die sites, (2) contaminating adjacent dice and mold bodies by omitting attachment of dice to reject die sites, and (3) processing support elements that include a minimal number of substrates due to prior separation of the defective substrates, the industry pays a premium price for support elements having no reject die sites. This also increases semiconductor package manufacturing costs.
Accordingly, there is a need for a process for making semiconductor packages using support elements having one or more reject die sites without contaminating adjacent dice and without destroying functional dice by attaching the dice to reject die sites. To this end, there is a need for support elements having modified reject die sites to eliminate risk of contamination of adjacent dice on a support element, during encapsulation and to preserve functional dice for use on functional die sites.
SUMMARY OF THE INVENTION
In light of the deficiencies of the prior art, this invention provides semiconductor package support elements including cover members attached to one or more reject die sites. The present invention further provides methods for making the support elements of the present invention and for making semiconductor packages using the same.
According to the present invention, reject die sites on defective substrates of a support element are covered prior to the encapsulation process using a cover member. The cover member comprises, for example, pressure-sensitive or temperature-activated tape, reject dies, or the like. The support elements and methods of the present invention virtually eliminate bleeding or flashing during encapsulation due to the presence of reject die sites. The support elements and methods of the present invention further ensure that functional dice are not sacrificed by being attached to reject die sites, thereby decreasing manufacturing costs while increasing yield of functional semiconductor packages.


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