Semiconductor package having improved adhesiveness and...

Active solid-state devices (e.g. – transistors – solid-state diode – Housing or package – With semiconductor element forming part

Reexamination Certificate

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C257SE23001, C257SE23031, C257SE23050, C257SE23061, C257S696000, C257S698000, C257S796000, C257S666000, C257S712000, C257S713000, C257S717000, C257S707000, C257S711000, C257S786000, C257S784000

Reexamination Certificate

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07067908

ABSTRACT:
A semiconductor package having improved adhesiveness between the chip paddle and the package body and having improved ground-bonding of the chip paddle. A plurality of through-holes are formed in the chip paddle for increasing the bonding strength of encapsulation material in the package body. A plurality of tabs are formed in the chip paddle may also be used alone or in conjunction with the through-holes to further increase the bonding strength of the encapsulation material in the package body. The tabs provide additional area for the bonding site to ground wires from the semiconductor chip by increasing the length of the chip paddle.

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