Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2007-07-17
2010-11-09
Raymond, Edward (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
Reexamination Certificate
active
07831405
ABSTRACT:
A semiconductor package includes an input pin that receives a first signal from the outside of the semiconductor package, a pad that is coupled to the input pin, and a test mode driving circuit that receives the first signal from the pad and outputs a plurality of test mode signals to drive a test apparatus in a semiconductor chip.
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Hynix / Semiconductor Inc.
Kaminski Jeffri A.
Raymond Edward
Venable LLP
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