Semiconductor device manufacturing: process – Forming bipolar transistor by formation or alteration of... – On insulating substrate or layer
Reexamination Certificate
2007-09-11
2007-09-11
Nhu, David (Department: 2818)
Semiconductor device manufacturing: process
Forming bipolar transistor by formation or alteration of...
On insulating substrate or layer
C438S455000, C438S513000, C438S680000, C257SE21170, C257SE21320
Reexamination Certificate
active
11213130
ABSTRACT:
Methods and apparatus provide for: a silicon on insulator structure, comprising: a glass substrate; a layer of semiconductor material; and a deposited barrier layer of between about 60 nm to about 600 nm disposed between the glass substrate and the semiconductor material, where the glass substrate and semiconductor material are bonded together via electrolysis.
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Couillard James Gregory
Gadkaree Kishor Purushottam
Corning Incorporated
Nhu David
Schaeberle Timothy M.
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