Semiconductor on glass insulator with deposited barrier layer

Semiconductor device manufacturing: process – Forming bipolar transistor by formation or alteration of... – On insulating substrate or layer

Reexamination Certificate

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C438S455000, C438S513000, C438S680000, C257SE21170, C257SE21320

Reexamination Certificate

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11213130

ABSTRACT:
Methods and apparatus provide for: a silicon on insulator structure, comprising: a glass substrate; a layer of semiconductor material; and a deposited barrier layer of between about 60 nm to about 600 nm disposed between the glass substrate and the semiconductor material, where the glass substrate and semiconductor material are bonded together via electrolysis.

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