Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Chip mounted on chip
Reexamination Certificate
2007-04-24
2007-04-24
Parker, Kenneth (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Combined with electrical contact or lead
Chip mounted on chip
C257S784000, C257S672000, C257S676000, C257S690000, C257S689000, C257S797000, C257S674000, C257SE23179
Reexamination Certificate
active
10863808
ABSTRACT:
First alignment marks are provided on a film substrate in a manner that they are located at positions offset from the disposed positions of second alignment marks provided on a semiconductor chip. The amount of expansion or contraction of the film substrate is obtained by measuring the distance between the first alignment marks. Based on the amount of expansion or contraction, the semiconductor chip is shifted with respect to the film substrate and mounted thereon.
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Examination result issued in corresponding Japanese application.
Harness & Dickey & Pierce P.L.C.
Nguyen Joseph
Parker Kenneth
Seiko Epson Corporation
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