Semiconductor memory having error correcting means

Details Semiconductor memory having error correcting means Semiconductor memory having error correcting means

1986-04-17

1988-02-16

Atkinson, Charles E.

Excavating

371 21, G06F 1110, G01R 3128

Patent

active

047260211

ABSTRACT:
A semiconductor memory having an error correcting function is provided, which has a device by which the user finds no difficulty in making use of the semiconductor memory and can test it with ease. In the semiconductor memory, a signal indicative of the completion of the preparation for reading/writing is outputted from the memory so that the user, after detecting the output of this signal, performs reading/writing data. To facilitate tests, such as a memory cell test for a redundant bit (check bit), an encoding circuit test and a decoding circuit test, the present invention provides that the arranged tests can be made independently of each other.

REFERENCES:
patent: 3836957 (1974-09-01), Duke et al.
patent: 4048481 (1977-09-01), Bailey, Jr. et al.
patent: 4359771 (1982-11-01), Johnson et al.
patent: 4365332 (1982-12-01), Rice
patent: 4380071 (1983-04-01), Odaka
patent: 4388684 (1983-06-01), Nibby, Jr. et al.
patent: 4410988 (1983-10-01), Suelflow et al.

Affiliated with

Also associated with

Rating

Semiconductor memory having error correcting means does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor memory having error correcting means, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor memory having error correcting means will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2225152