Semiconductor memory device which generates voltages...

Static information storage and retrieval – Floating gate – Particular connection

Reexamination Certificate

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C365S185030, C365S185240

Reexamination Certificate

active

07460402

ABSTRACT:
A memory cell MC stores a plurality of bits of data using threshold levels 1, 2, . . . , n (n is a natural number). A storage section stores a plurality of items of parameter data for generating the threshold levels. An arithmetic circuit generates voltage data for generating voltages corresponding to the threshold levels by accumulating the parameter data read from the storage section. A voltage generating circuit generates a voltage on the basis of the voltage data generated by the arithmetic circuit. The arithmetic circuit, when reading data from the memory cell at threshold level k (k<=n), generates the voltage data by accumulating parameter data at the threshold levels i to k (i<=k).

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U.S. Appl. No. 11/564,618, filed Nov. 29, 2006, Shibata, et al.

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