Semiconductor memory device including means for checking the ope

Details Semiconductor memory device including means for checking the ope Semiconductor memory device including means for checking the ope

1994-04-28

1995-10-31

Nguyen, Hoa T.

Excavating

371 671, G06F 1100, G06F 1130, G11C 2900

Patent

active

054636353

ABSTRACT:
A data string representing the initial value (00000000) is supplied to an internal address generator. The internal address initial setting load signal is input to cause the internal address generator to be initialized. Then, a first detection signal is read out from the first detection circuit, and the level of the signal is checked. If the level of the first detection signal is HIGH, it indicates that the initialization of the internal address generator has been conducted normally. If the level of the first detection signal is LOW, it indicates that the initialization of the internal address generator has not been conducted normally. Thereafter, the count-up operation of the internal address generator is conducted while a count-up signal is supplied a predetermined number of times (255 times) to the internal address generator. A second detection signal is read out from a second detection circuit, and the level of the signal is checked. If the level of the second detection signal is HIGH, it indicates that the count-up operation of the internal address generator has normally been conducted. If the level of the second detection signal is LOW, it indicates that the count-up operation of the internal address generator has not been conducted normally.

REFERENCES:
patent: 4682328 (1987-07-01), Ramsay et al.
patent: 4773046 (1988-09-01), Akaogi et al.
patent: 4797886 (1989-01-01), Imada
patent: 5119380 (1992-06-01), Ohwada et al.
Alan Bentley, "Ram Tester Adapts to Memory Interface Requirements", Computer Design/Jun. 1979, pp. 124-136.
Rudy, "Memory Word Line Monitor", IBM Corp., 1976, p. 499.

Affiliated with

Also associated with

Rating

Semiconductor memory device including means for checking the ope does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor memory device including means for checking the ope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor memory device including means for checking the ope will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1779424