Semiconductor memory device having data-compress test mode

Details Semiconductor memory device having data-compress test mode Semiconductor memory device having data-compress test mode

2006-09-28

2009-08-11

Luu, Pho M. (Department: 2824)

Static information storage and retrieval

Addressing

Particular decoder or driver circuit

C365S230030, C365S230050, C365S233100

Reexamination Certificate

active

07573776

ABSTRACT:
A semiconductor memory device includes a plurality of column circuit units selectively operated with a burst length set in a mode register set. A plurality of column control blocks control column access to unit cells, each block activated by each of plural column control signals, and a column control signal generator outputs the plural column control signals to the plural column control blocks in response to a column access command and a burst length.

REFERENCES:
patent: 6717834 (2004-04-01), Zagorianakos et al.
patent: 6795899 (2004-09-01), Dodd et al.
patent: 6958935 (2005-10-01), Lee et al.
patent: 7017010 (2006-03-01), La
patent: 7133995 (2006-11-01), Isaac et al.
patent: 2003/0076719 (2003-04-01), Byeon et al.
patent: 2005/0254307 (2005-11-01), Dietrich et al.
patent: 2006/0067158 (2006-03-01), La
patent: 11-7764 (1999-01-01), None
patent: 2002-008389 (2002-01-01), None
patent: 2005-235335 (2005-09-01), None
patent: 1998-057449 (1998-09-01), None
patent: 100242720 (1999-11-01), None
patent: 10-2006-0059036 (2006-06-01), None
patent: 10-2006-0077813 (2006-07-01), None
Korean Office Action issued in corresponding Korean Patent Application No. KR 10-2006-0040697, issued on Jan. 7, 2008.
Korean Office Action, with English Translation, issued in corresponding Korean Patent Application No. 10-2006-0040697, dated on Jul. 16, 2007.

Affiliated with

Also associated with

Rating

Semiconductor memory device having data-compress test mode does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor memory device having data-compress test mode, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor memory device having data-compress test mode will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4116896