Static information storage and retrieval – Addressing – Plural blocks or banks
Reexamination Certificate
1998-09-28
2001-04-10
Elms, Richard (Department: 2824)
Static information storage and retrieval
Addressing
Plural blocks or banks
C365S189050, C365S230080
Reexamination Certificate
active
06215717
ABSTRACT:
BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention generally relates to a semiconductor memory device and, more particularly, to a semiconductor memory device having a write area divided into a plurality of blocks so that written information can be protected from being rewritten on an individual block basis.
Recently, in association with unity with regard to a power source for non-volatile semiconductor memory devices, a demand for a function to prevent recorded information from being erroneously rewritten, that is, a write-protection function, has been increased.
2. Description of the Related Art
A conventional semiconductor device has a write area divided into a plurality of blocks, and written information in the write area is prevented from being rewritten. This function is referred to as a write-protection function. A setting operation of the write protection is performed on an individual block basis.
A description will now be given, with reference to
FIG. 1
, of a write-protection circuit provided in the conventional semiconductor device.
The write-protection circuit
201
shown in
FIG. 1
comprises: a write-protection control circuit
212
which controls an operation for setting write-protection information; an input buffer circuit
23
which inputs an address signal for designating a block to be write-protected; a decode circuit
24
which decodes the address signal so as to designate the block to which the write-protection information is set; and a write-protection setting circuit
211
which performs the operation for setting the write-protection to the block designated by the operation of the write-protection control circuit
212
.
The write-protection circuit
201
performs the write-protection setting operation based on the address signal and externally input control signals such as an output enable signal OE and a write enable signal WE. That is, when there is a plurality of blocks to be write-protected, a plurality of write-protection setting operations are performed for the blocks on an individual block basis.
It should be noted that the write-protection circuit
201
of the conventional semiconductor memory device uses an address signal A
6
as a control signal for the write-protection setting operation. Additionally, the write-protection circuit
201
uses the uppermost address signals A
14
, A
15
and A
16
(represented as Ai in
FIG. 1
) as a signal for designating a block to which the write-protection setting operation is applied.
The write-protection setting circuit
211
includes, as shown in
FIG. 2
, write-protection memory circuits
221
a
through
221
g
each of which stores the write-protection information for a respective one of the blocks. The write protection is set by storing the write-protection information in each of the write-protection memory circuits
221
a
through
221
g.
Additionally, the conventional semiconductor device turns on an N-channel transistor
33
by changing a signal PDC
3
shown in
FIG. 2
from 0 Vcc to 0.5 Vcc each time a data writing operation is performed so as to read a write-protection signal WP which corresponds to the write-protection information provided to the block to which the data write operation is applied. That is, the write-protection signal to be read is the write-protection information stored in one of the protection memory circuits
211
a
through
221
g
provided to one of the blocks to which the data write operation is to be performed. It should be noted that the write-protection information represents whether the write-protection for each of the blocks is set or canceled.
Specifically, the conventional semiconductor memory device recognizes that the block is write-protected when the write-protection signal WP is at a high level (“H”). On the other hand, when the write-protection signal WP is at a low level (“L”), it is recognized that the write-protection of the block has been canceled.
A description will now be given, with reference to
FIG. 3
, of a write-protection setting operation performed by the write-protection circuit
201
.
When the address signal Ai (A
14
, A
15
, A
16
) is input to the input buffer circuit
23
, the decode circuit
24
decodes the address signal Ai so as to designate one of the blocks to which the write-protection setting operation is applied. For example, when the block
0
is designated, a block signal BLK
0
is set to the high level (FIG.
3
-{circle around (
1
)}).
FIG.4
is a circuit diagram of the write-protection control circuit
212
shown in FIG.
1
. In the above-mentioned state, when the control signal OE/ is recognized by a high-voltage detecting circuit
41
, and the effective address signal A
6
and the control signal WE/ are input to a NAND gate
47
via input buffer circuits
42
and
43
, respectively, the write-protection control circuit
212
outputs a write signal WPP and a control gate signal WPG via inverters
48
and
49
, respectively.
Specifically, when the control signal OE=12V, the address signal A
6
=“L”, and the control signal WE=“L”, the write-protection control circuit
212
sets the write signal WPP and the control gate signal WPG to “H” (FIG.
3
-{circle around (
2
)}) so as to control the write-protection setting operation of the write-protection setting circuit
211
.
When both the signals WPP and WPG are “H”, the write-protection setting circuit
211
stores the write-protection information in one of the write-protection memory circuits
221
a
to
221
g
. In the present case, the write-protection information is stored in the protection memory circuit
221
a
which corresponds to the block
0
(the block signal BLK
0
). Each of the write-protection memory circuits
221
a
to
221
g
comprises, as shown in
FIG. 5
, a memory circuit which is a content addressable memory (CAM) cell
81
, a P-channel transistor
82
, an N-channel transistor
83
and a NAND gate
84
. Each of the write-protection memory circuits
221
a
to
221
g
stores the protection information corresponding to the designated block based on the signals WPP and WPG.
As mentioned above, the conventional write-protection circuit
201
performs the write-protection setting operation with respect to the block
0
(BLK
0
), and thereafter sequentially performs the write-protection setting operation for other blocks (BLKn) one after another (FIG.
3
-{circle around (
3
)}, {circle around (
4
)}, {circle around (
5
)}, {circle around (
6
)}, {circle around (
7
)}, {circle around (
8
)})
As mentioned above, the conventional semiconductor memory device must perform a plurality of write-protection setting operations when there are a plurality of blocks to be write-protected. Accordingly, there is a problem in that a relatively long time is required to set the write protection to all of the blocks to be write-protected. Specifically, a time for setting all of the blocks to be write-protected is calculated by multiplying a time (about 100 microseconds) needed to perform the write-protection setting operation for a single block by a number of blocks to be write-protected.
SUMMARY OF THE INVENTION
It is a general object of the present invention to provide a semiconductor memory device in which the above-mentioned problems are eliminated.
A more specific object of the present invention is to provide a semiconductor memory device which can reduce a time required for a write-protection setting operation when a plurality of blocks are to be write-protected by simultaneously performing the write-protection setting operations for all of the blocks to be write-protected.
In order to achieve the above-mentioned objects, there is provided according to the present invention a semiconductor memory circuit, comprising:
a write area divided into a predetermined number of blocks each of which is rewritable on an individual block basis; and
write-protection means for simultaneously setting write-protection information to a plurality of blocks that are arbitrarily designated from among the predetermined number of blocks so that the plurality of blocks are
Shoji Haruo
Takeguchi Tetsuji
Armstrong Westerman Hattori McLeland & Naughton LLP
Elms Richard
Fujitsu Limited
Nguyen Hien
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