Semiconductor memory device compensating leakage current

Static information storage and retrieval – Powering – Conservation of power

Reexamination Certificate

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Details

C365S228000, C365S226000, C365S203000, C365S206000

Reexamination Certificate

active

07848171

ABSTRACT:
A cell array has a plurality of memory cells arranged in a matrix. Each one terminal of a plurality of switching circuits is connected to a bit line. A leakage current compensating circuit has an output node connected in common to the other terminal of the switching circuit. The leakage current compensating circuit comprises a plurality of MOSFETs. Each MOSFET has the same conduction type as a MOSFET whose output node is directly connected to the bit line in the memory cell. Each MOSFET of the leakage current compensating circuit has a gate electrode connected to a first voltage node and a source electrode connected to a second voltage node, and thereby, being biased so that the MOSFET turns off.

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