Static information storage and retrieval – Powering – Conservation of power
Reexamination Certificate
2008-05-21
2010-12-07
Nguyen, Viet Q (Department: 2827)
Static information storage and retrieval
Powering
Conservation of power
C365S228000, C365S226000, C365S203000, C365S206000
Reexamination Certificate
active
07848171
ABSTRACT:
A cell array has a plurality of memory cells arranged in a matrix. Each one terminal of a plurality of switching circuits is connected to a bit line. A leakage current compensating circuit has an output node connected in common to the other terminal of the switching circuit. The leakage current compensating circuit comprises a plurality of MOSFETs. Each MOSFET has the same conduction type as a MOSFET whose output node is directly connected to the bit line in the memory cell. Each MOSFET of the leakage current compensating circuit has a gate electrode connected to a first voltage node and a source electrode connected to a second voltage node, and thereby, being biased so that the MOSFET turns off.
REFERENCES:
patent: 4371956 (1983-02-01), Maeda et al.
patent: 6181626 (2001-01-01), Brown
patent: 6335893 (2002-01-01), Tanaka et al.
patent: 6343039 (2002-01-01), Agawa et al.
patent: 6343045 (2002-01-01), Shau
patent: 6452852 (2002-09-01), Bohm et al.
patent: 6501687 (2002-12-01), Choi
patent: 6657911 (2003-12-01), Yamaoka et al.
patent: 6738280 (2004-05-01), Satomi
patent: 6801463 (2004-10-01), Khellah et al.
patent: 6967875 (2005-11-01), Chen et al.
patent: 7085184 (2006-08-01), Walther et al.
patent: 7085187 (2006-08-01), Koshikawa et al.
patent: 7161844 (2007-01-01), Sarin et al.
patent: 7193926 (2007-03-01), Park et al.
patent: 7245526 (2007-07-01), Oh et al.
patent: 7248494 (2007-07-01), Oh et al.
patent: 7355893 (2008-04-01), Ema
patent: 7379362 (2008-05-01), Abe et al.
patent: 7573748 (2009-08-01), Bedarida et al.
patent: 2002-208280 (2002-07-01), None
patent: 2006-079812 (2006-03-01), None
Kabushiki Kaisha Toshiba
Nguyen Viet Q
Turocy & Watson LLP
LandOfFree
Semiconductor memory device compensating leakage current does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor memory device compensating leakage current, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor memory device compensating leakage current will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4234757