Semiconductor memory device and method for testing the same

Details Semiconductor memory device and method for testing the same Semiconductor memory device and method for testing the same

2011-01-18

2011-01-18

Nguyen, Dang T (Department: 2824)

Static information storage and retrieval

Addressing

Sync/clocking

C365S189110, C365S189050

Reexamination Certificate

active

07872940

ABSTRACT:
Semiconductor memory device and method for testing the same includes a unit for characterized in that a burst length is increased in a test of a read operation and a write operation and a unit for connecting a plurality of banks to one data pad by sequentially and outputting the data.

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patent: 10-2005-0074246 (2005-07-01), None
patent: 10-2005-0089900 (2005-09-01), None
patent: 10-0576453 (2006-04-01), None

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