Semiconductor device manufacturing: process – Chemical etching
Reexamination Certificate
2005-12-20
2005-12-20
Huynh, Andy (Department: 2818)
Semiconductor device manufacturing: process
Chemical etching
C438S184000, C438S230000, C438S265000, C438S303000, C438S595000
Reexamination Certificate
active
06977226
ABSTRACT:
The present invention provides a semiconductor memory device capable of preventing bridge formations in a peripheral circuit region and improving a process margin and a method for fabricating the same. The semiconductor memory device includes: a cell region; a peripheral circuit region adjacent to the cell region; and a plurality of line patterns formed in the cell region and the peripheral circuit region, wherein a spacing distance between the line patterns is at least onefold greater than a width of the line pattern.
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Huynh Andy
Hynix / Semiconductor Inc.
Mayer Brown Rowe & Maw LLP
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