Active solid-state devices (e.g. – transistors – solid-state diode – Gate arrays – With particular signal path connections
Reexamination Certificate
2011-07-19
2011-07-19
Mandala, Victor (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Gate arrays
With particular signal path connections
C257S202000, C257S211000, C257SE27081, C257SE29170, C257SE29119
Reexamination Certificate
active
07982244
ABSTRACT:
A semiconductor memory device includes a first block having first memory cells and first select transistors, a second block having second memory cells and second select transistors, and arranged adjacent to the first block in a first direction, the second select transistor being arranged to face the first select transistor and commonly having a diffusion region with the first select transistor, a first interconnection layer provided on the diffusion region between the first and second blocks and extending in a second direction, and a second interconnection layer having a first portion provided in contact with an upper portion of the first interconnection layer and extending to a portion outside the first interconnection layer, and a second portion extending in the second direction and connected to the first portion in a portion outside a portion on the first interconnection layer.
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Arai Fumitaka
Nitta Hiroyuki
Sato Atsuhiro
Kabushiki Kaisha Toshiba
Mandala Victor
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
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