Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2011-04-12
2011-04-12
Phung, Anh (Department: 2824)
Static information storage and retrieval
Floating gate
Particular biasing
C365S204000
Reexamination Certificate
active
07924627
ABSTRACT:
In a semiconductor memory device, a voltage rise due to IR-DROP is suppressed which occurs when a ground voltage is applied to a memory cell during a program operation. Discharge transistors are provided between the ground and bit lines connected to the source and drain of the memory cell. The discharge transistors receive mutually independent discharge control signals which are generated and outputted from a DS decoder driver at the respective gates thereof. To the bit line which applies the ground voltage to the memory cell, the ground voltage can be set using the discharge transistor.
REFERENCES:
patent: 5229963 (1993-07-01), Ohtsuka et al.
patent: 6301158 (2001-10-01), Iwahashi
patent: 6487124 (2002-11-01), Semi
patent: 6909639 (2005-06-01), Park et al.
patent: 7405978 (2008-07-01), Hahn et al.
patent: 2004/0184318 (2004-09-01), Morikawa
patent: 2007-128583 (2007-05-01), None
Haruyama Hoshihide
Kouno Kazuyuki
Mochida Reiji
Nakayama Masayoshi
McDermott Will & Emery LLP
Panasonic Corporation
Phung Anh
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