Semiconductor memory device

Static information storage and retrieval – Associative memories – Ferroelectric cell

Reexamination Certificate

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C365S189070

Reexamination Certificate

active

11711816

ABSTRACT:
There is provided a control circuit (409) for fetching a result of a comparison of a part of bits of entry data with a corresponding bit of comparison data and prohibiting a comparison of residual bits in the entry data with the corresponding bit of the comparison data when the result of the comparison is mismatched, and the comparison of the residual bits in the entry data with the corresponding bit of the comparison data is prohibited. Consequently, the number of signal lines to be activated in one cycle of a comparing operation is decreased. Thus, a reduction in a consumed power can be achieved.

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