Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2006-06-13
2006-06-13
Dinh, Son T. (Department: 2824)
Static information storage and retrieval
Floating gate
Particular biasing
C365S185050, C365S185110, C365S185270
Reexamination Certificate
active
07061807
ABSTRACT:
A semiconductor memory device comprises memory cells, a bitline connected to the memory cells, a read circuit including a precharge circuit, and a first transistor connected between the bitline and the read circuit, wherein a first voltage is applied to a gate of the first transistor when the precharge circuit precharges the bitline, and a second voltage which is different from the first voltage is applied to the gate of the first transistor when the read circuit senses a change in a voltage of the bitline.
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Nakamura Hiroshi
Tanaka Tomoharu
Tanzawa Toru
Banner & Witcoff Ltd
Kabushiki Kaisha Toshiba
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