Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2008-04-15
2008-04-15
Jackson, Jerome (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257S003000, C257S004000, C257S005000, C257S326000, C257S536000, C365S232000
Reexamination Certificate
active
11075481
ABSTRACT:
A semiconductor memory cell, a method for fabricating it and a semiconductor memory device. A phase change material region of a storage element of the semiconductor memory cell has been or is formed as a lining region of a wall region of a contact recess which passes all the way through an insulation region between a first electrode device and a second electrode device. Furthermore, the space or region of the contact recess which is not taken up by the material region of the storage element has been or is made substantially electrically insulating.
REFERENCES:
patent: 2002/0017701 (2002-02-01), Klersy et al.
patent: 2003/0047765 (2003-03-01), Campbell
patent: 2003/0209746 (2003-11-01), Horii
patent: 2004/0026686 (2004-02-01), Lung
patent: 04045584 (1992-02-01), None
Pinnow Cay-Uwe
Ufert Klaus-Dieter
Dicke Billig & Czaja, PLLC
Infineon - Technologies AG
Jackson Jerome
Valentine Jami M
LandOfFree
Semiconductor memory cell, method for fabricating it and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor memory cell, method for fabricating it and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor memory cell, method for fabricating it and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3942123