Measuring and testing – Dynamometers – Responsive to multiple loads or load components
Reexamination Certificate
2005-12-13
2005-12-13
Noori, Max (Department: 2855)
Measuring and testing
Dynamometers
Responsive to multiple loads or load components
Reexamination Certificate
active
06973844
ABSTRACT:
A semiconductor mechanical quantity sensor includes two sensor chips (100a,100b) having the same structure and the same characteristics formed on semiconductor substrates (10a,10b), arranged on a circuit chip (6) in the same direction. There may be used a sensor chip having two sensors of the same structure formed in one semiconductor substrate in the same direction. The number of the sensors may be three or more. A plurality of sensors may be stacked on the semiconductor substrate or on the circuit chip, or may be arranged on both surfaces of the semiconductor substrate (10a,10b) or the circuit chip (6).
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patent: 6171881 (2001-01-01), Fujii
patent: 6414381 (2002-07-01), Takeda
patent: 6462530 (2002-10-01), Layton
patent: 2002/0011111 (2002-01-01), Otsuchi et al.
patent: A-2000-9470 (2000-01-01), None
Denso Corporation
Miller Takisha
Noori Max
Posz Law Group , PLC
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