Semiconductor manufacturing method using buried nitride formed b

Metal treatment – Compositions – Heat treating

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29578, 148187, 357 23, 357 24, 357 42, 357 54, 427 94, 427248B, H01L 21265, H01L 2131

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041135156

ABSTRACT:
The invention relates to a method of manufacturing a semiconductor device in which a surface of a silicon semiconductor region covered at least partly with a silicon oxide-containing layer is subjected to a nitridation treatment forming a buried zone of a nitrogen-containing material between the silicon oxide layer and the silicon region, which zone is used in a further phase of the manufacture or in the manufactured semiconductor device.

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