Semiconductor light emitting device member, method for...

Active solid-state devices (e.g. – transistors – solid-state diode – Incoherent light emitter structure – Encapsulated

Reexamination Certificate

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C257S040000, C257S079000, C257SE33059, C438S026000

Reexamination Certificate

active

07859006

ABSTRACT:
A semiconductor light-emitting device member excellent in transparency, light resistance, and heat resistance and capable of sealing a semiconductor light-emitting device without causing cracks and peeling even after a long-time use is provided wherein the semiconductor light-emitting device member contains (A) in a solid Si-nuclear magnetic resonance spectrum, at least one peak selected from (a) peaks whose peak top position is in an area of a chemical shift of −40 ppm to 0 ppm inclusive, and whose full width at half maximum is 0.3 ppm to 3.0 ppm inclusive, and (b) peaks whose peak top position is in an area of the chemical shift of −80 ppm or more and less than −40 ppm, and whose full width at half maximum is 0.3 ppm to 5.0 ppm inclusive, wherein (B) silicon content is 20 weight % or more and (C) silanol content is 0.1 weight % to 10 weight % inclusive.

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Brennan et al. “Fluorescence and NMR Characterization and Biomolecule Entrapment Studies of Sol-Gel-Derived Organic-Inorganic Composite Materials Formed by Sonication of Precursors” Chem. Mater., 1999, 11 (7), pp. 1853-1864.
U.S. Appl. No. 12/067,859, filed Mar. 24, 2008, Kato, et al.

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