Semiconductor leakage current detector and leakage current...

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Details

C324S133000, C324S522000, C327S063000, C327S082000, C340S644000

Reexamination Certificate

active

07446549

ABSTRACT:
A semiconductor leakage current detector of the present invention includes a first analog switch which causes a current to be measured to flow or to be cut off, a second analog switch which causes a reference current to flow or to be cut off, an integral capacitance element which is connected by the first analog switch and the second analog switch and is charged with the current to be measured or the reference current, a discharge unit which discharges the integral capacitor, and a comparison unit which compares the reference voltage with each of an integral voltage generated in the integral capacitor by a reference current after the discharge of the integral capacitor and an integral voltage generated in the integral capacitance element by the current to be measured after the discharge of the integral capacitor.

REFERENCES:
patent: 5410511 (1995-04-01), Michiyama
patent: 5774404 (1998-06-01), Eto
patent: 5986940 (1999-11-01), Atsumi et al.
patent: 6052307 (2000-04-01), Huber et al.
patent: 6201747 (2001-03-01), Venkatesh et al.
patent: 6370061 (2002-04-01), Yachareni et al.
patent: 6839279 (2005-01-01), Yamada
patent: 7035131 (2006-04-01), Huang et al.
patent: 2005/0146346 (2005-07-01), Kakizawa et al.
patent: 2005/0229050 (2005-10-01), Kanda
patent: 61137075 (1986-06-01), None
patent: 6-251593 (1994-09-01), None
English Language Abstract of JP 6-251593.

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