Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-12-21
2008-11-04
Nguyen, Ha Tran T (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S133000, C324S522000, C327S063000, C327S082000, C340S644000
Reexamination Certificate
active
07446549
ABSTRACT:
A semiconductor leakage current detector of the present invention includes a first analog switch which causes a current to be measured to flow or to be cut off, a second analog switch which causes a reference current to flow or to be cut off, an integral capacitance element which is connected by the first analog switch and the second analog switch and is charged with the current to be measured or the reference current, a discharge unit which discharges the integral capacitor, and a comparison unit which compares the reference voltage with each of an integral voltage generated in the integral capacitor by a reference current after the discharge of the integral capacitor and an integral voltage generated in the integral capacitance element by the current to be measured after the discharge of the integral capacitor.
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English Language Abstract of JP 6-251593.
Komiya Manabu
Mori Toshiki
Suwa Hitoshi
Tomita Yasuhiro
Greenblum & Bernstein P.L.C.
Kusumakar Karen M
Matsushita Electric - Industrial Co., Ltd.
Nguyen Ha Tran T
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