Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates – Thinning of semiconductor substrate
Patent
1996-02-08
1998-12-22
Niebling, John F.
Semiconductor device manufacturing: process
Bonding of plural semiconductor substrates
Thinning of semiconductor substrate
438928, 438977, H01L 21030, H01L 2146
Patent
active
058519025
ABSTRACT:
A layered structure for a semiconductor substrate has a planar surface, lighter weight, and increased flexural rigidity. By decreasing warping in a multilayered recording medium that arises when forming the recording layer, while suppressing an increase in the weight of the memory substrate, a recording medium for a compact, large capacity memory device can be manufactured. The recording medium is positioned opposite a read/write circuit substrate that is provided with a plurality of miniature probes. A recording layer is formed on a front surface of a memory substrate, a beam structure for reinforcing flexural rigidity is formed on a back surface of said memory substrate. A conductive layer may be formed between the memory substrate and the recording layer.
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Wolf et al., Silicon Processing for the VLSI Era: vol. 1-Process Technology, Lattice Press, p. 539, 1986.
Hewlett--Packard Company
Niebling John F.
Zarneke David A.
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