Semiconductor laser element and method for producing same

Coherent light generators – Particular resonant cavity – Specified cavity component

Reexamination Certificate

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C372S049010, C438S029000

Reexamination Certificate

active

07822094

ABSTRACT:
A semiconductor laser element realizes a high COD light output in broader range of reflection factor at a facet with high reliability. A semiconductor laser element has a multi-layered reflection film formed on at least one end facet of a resonator. An optical path length of each layer of said multi-layered reflection film is determined by (2m−1)·λ/4, where λ is oscillation wavelength, and m is positive integer). A high-refractive-index layer and a low-refractive-index layer are alternately stacked starting from a first layer adjacent to said semiconductor.

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Michael Ettenberg, “A new dielectric facet reflector for semiconductor lasers”, Applied Physics Letters, vol. 32, No. 11, pp. 725-726, 1978.
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Kouji Nakahara, et al., Transmission Properties of 1.3-μm InGaA1As MQW FP Lasers in 10-Gb/s Uncooled Operation, Journal of Lightwave Technology, vol. 23, No. 12, pp. 3997-4003, (2005).

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