Semiconductor laser apparatus

Coherent light generators – Particular resonant cavity – Specified cavity component

Reexamination Certificate

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C372S043010, C372S050124, C372S081000, C372S108000

Reexamination Certificate

active

07609745

ABSTRACT:
A novel semiconductor laser device is provided which can suppress internal optical absorption even when In is used as a material for a semiconductor multilayer mirror containing a nitride. The semiconductor laser device has two mirrors disposed to face each other, and an active layer disposed therebetween. At least one of the mirrors is a multilayer mirror having first nitride semiconductor layers containing Ga and second nitride semiconductor layers containing Al, which are alternately laminated to each other. The second nitride semiconductor layer contains In and includes a first region having a refractive index lower than that of the first nitride semiconductor layer, and a second region having a refractive index lower than that of the first nitride semiconductor layer and an In concentration lower than that of the first region. The second region is disposed closer to the active layer than the first region.

REFERENCES:
patent: 2002/0176474 (2002-11-01), Huang et al.
patent: 2005/0087753 (2005-04-01), D'Evelyn et al.
patent: 2007/0003697 (2007-01-01), Carlin et al.
patent: 2007/0131950 (2007-06-01), Takeuchi
patent: 7-297476 (1995-11-01), None
Carlin, J.-F. et al., “Lattice-matched AllnN/GaN Distributed Bragg Reflectors for Nitride Microcavities”,http://www.ioffe.rssi.ru/PLMCN4/abstracts/W4—1.pdf, 4thInternational Conference on Physics of Light-matter Coupling in Nanostructures (St. Petersburg, Russia) Jun. 29-Jul. 3, 2004.
Carlin, J.-F. et al., “Crack-free Fully Epitaxial Nitride Microcavity Using Highly Reflective AllnN/GaN Bragg Mirrors”, Appl. Phys. Letters, 86 (031107), 2005, pp. 031107-1 to 031107-3.

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