Semiconductor intergrated circuit device

Details Semiconductor intergrated circuit device Semiconductor intergrated circuit device

1987-08-03

1989-09-26

Eisenzopf, Reinhard J.

Excavating

371 251, G01R 3100, G01R 3102

Patent

active

048703451

ABSTRACT:
A semiconductor integrated circuit includes cascaded asynchronous sequential logic circuits. Scanning shift registers are provided between the asynchronous sequential circuits to permit test data to be applied to the inputs of the circuits and to latch and shift out output data provided by the circuits in response to the test data. Additional gating circuitry is provided between the scanning shift registers and the inputs of the asynchronous sequential circuits to prevent new data latched into the scanning shift register from causing the asynchronous sequential circuit connected to the scanning shift register output from changing state during testing. This same additional circuitry may be used to provide pulses of controlled width and/or timing to asynchronous sequential circuit inputs in response to externally generated gating control signals.

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