Semiconductor integrated comparator circuit

Details Semiconductor integrated comparator circuit Semiconductor integrated comparator circuit

1993-08-13

1995-08-08

Callahan, Timothy P.

Miscellaneous active electrical nonlinear devices, circuits, and

Specific signal discriminating without subsequent control

By amplitude

327 63, 327563, H03K 522

Patent

active

054402530

ABSTRACT:
A very dense polarity detection circuit which detects the polarity of a dc voltage on a transmission line. When incorporating such a very sense detection circuit, a semiconductor integrated circuit device is formed of a reduced number of parts. The polarity detection circuit for detecting the polarities of dc voltages on transmission lines (51) and (52) includes an input circuit (4), a clamp circuit (5), a comparison circuit (6) and a control circuit (7). The input circuit (4) has a high input impedance and receives a voltage-divide potential at a predetermined ratio. The clamp circuit (5) clamps outputs of the input circuit (4) at a predetermined voltage so that outputs from the clamp circuit (5) are not each smaller than a ground potential by a preselected voltage. The outputs of clamp circuit (5) are supplied to the comparison circuit (6) and the control circuit (7). The control circuit (7), judging that a potential difference between the transmission lines (51) and (52) is larger than the predetermined voltage, outputs a control signal by which the comparison circuit (6) compares potentials on the transmission lines (51) and (52) and outputs a result of comparison. Since the polarity detection circuit is highly densified, reduction is achieved in the number of parts which are necessary to fabricate the semiconductor integrated circuit device, and hence, in the size of the semiconductor integrated circuit device.

REFERENCES:
patent: 4362956 (1982-12-01), Ogasawara et al.
patent: 5049761 (1991-09-01), Zitta
patent: 5115151 (1992-05-01), Hull et al.
patent: 5166548 (1992-11-01), Nelson

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