Patent
1984-11-09
1985-09-24
Edlow, Martin H.
357 42, 357 41, 357 55, 357 56, 357 71, 357 49, H01L 2702, H01L 2906
Patent
active
045435928
ABSTRACT:
A semiconductor integrated circuit in which layers such as an field isolation region, a gate electrode, interlayer insulating films and interconnection lines are formed by the combined use of a lift-off process and an ECR plasma deposition process. According to the present invention, even if vertical dimensions of patterns of the respective layers are large as compared with their lateral dimensions, the upper surfaces of the respective layers can be planarized, permitting the fabrication of an LSI of high packing density, high operating speed and high reliability which is free from shorting and breakage of the interconnection lines.
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James, R. P., "Complementary Metal-Oxide Semiconductor Device", IBM Tech. Discl. Bull., vol. 16, No. 6, p. 1998, Nov. 1973.
Lee, C. H., "Bipolar Transistor Fabrication Process", IBM Tech. Discl. Bull., vol. 20, No. 5, pp. 1753-1754, Oct. 1977.
Ehara Kohei
Itsumi Manabu
Matsuo Seitaro
Muramoto Susumu
Edlow Martin H.
Nippon Telegraph and Telephone Public Corporation
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