Semiconductor integrated circuit with voltage limiter having dif

Details Semiconductor integrated circuit with voltage limiter having dif Semiconductor integrated circuit with voltage limiter having dif

1988-01-04

1990-04-10

Smith, Jerry

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

3072961, 323269, 323270, 323303, G01R 3110, H02M 3158

Patent

active

049163892

ABSTRACT:
In a voltage converter which is disposed in a semiconductor integrated circuit so as to lower an external supply voltage and to feed the lowered voltage to a partial circuit of the integrated circuit, the voltage converter is constructed so as to produce an output voltage suited to an ordinary operation in the ordinary operation state of the semiconductor integrated circuit and an aging voltage in the aging test of the circuit.

REFERENCES:
patent: 2697201 (1954-12-01), Harder
patent: 3386030 (1968-05-01), Kann
patent: 3523195 (1970-08-01), Thomas et al.
patent: 3553487 (1971-01-01), Freebarn
patent: 3588675 (1971-06-01), Suzuki
patent: 3742338 (1973-06-01), Sugano et al.
patent: 4409677 (1983-10-01), Takemae et al.
patent: 4455628 (1984-06-01), Ozaki et al.
patent: 4485985 (1984-11-01), Itoh et al.
patent: 4495622 (1985-01-01), Charrau
patent: 4585955 (1986-04-01), Uchida

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