Semiconductor integrated circuit with self-test function

Details Semiconductor integrated circuit with self-test function Semiconductor integrated circuit with self-test function

1990-12-03

1991-09-24

Smith, Jerry

Excavating

371 225, 371 251, G06F 1100

Patent

active

050519972

ABSTRACT:
Apparatus is disclosed for a self-test function internal to a semiconductor integrated circuit. The invention includes an internal random number generator for generating test data for use by a self-test program. As a result of the invention, external equipment is not necessary for executing the self-test, internal memory for storing for self-test data can be decreased, and self-test can be performed readily by the user. Furthermore, since self-test result data is compressed so as to be compared with the data of prediction values, the data of the test result can be reduced for easy processing.

REFERENCES:
patent: 4503536 (1985-03-01), Panzer
patent: 4601033 (1986-07-01), Whelan
patent: 4817093 (1989-03-01), Jacobs
"Bit-Pushing Approach to VLSI Circuit Self-Testing", IBM TDB, vol. 28, No. 2, 7/1985, pp. 676-679.
Kubem and Bruce, "The MC6804P2 Built-In Self-Test", Proceedings from '83 Intl. Test Conference, pp. 295-300.

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