Semiconductor integrated circuit with fuse data read circuit

Details Semiconductor integrated circuit with fuse data read circuit Semiconductor integrated circuit with fuse data read circuit

2007-12-11

2007-12-11

Phung, Anh (Department: 2824)

Static information storage and retrieval

Read only systems

Fusible

C365S189011, C365S189090, C365S225700

Reexamination Certificate

active

11409389

ABSTRACT:
A first fuse element, a second fuse element, a read trim value automatic adjustment circuit, and a fuse data read circuit are provided. The second fuse element determines a data reading condition for the first fuse element. The read trim value automatic adjustment circuit applies a constant voltage across the second fuse element prior to reading data from the first fuse element, then reads data from the second fuse element and, on the basis of the results of the read, outputs a trim value to specify the desired read condition for the first fuse element. The fuse data read circuit applies a constant voltage across the first fuse element and then reads data from it according to the read timing or the read reference voltage set on the basis of the trim value output from the read trim value automatic adjustment circuit.

REFERENCES:
patent: 5995413 (1999-11-01), Holzmann et al.
patent: 6472897 (2002-10-01), Shyr et al.
patent: 7187599 (2007-03-01), Schnell et al.
patent: 2002/0069394 (2002-06-01), Gavrila et al.
patent: 2005/0280495 (2005-12-01), Douzaka et al.
patent: 2002-231816 (2002-08-01), None

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