Semiconductor integrated circuit with functional blocks capable

Details Semiconductor integrated circuit with functional blocks capable Semiconductor integrated circuit with functional blocks capable

1992-12-21

1995-05-16

Beausoliel, Jr., Robert W.

Excavating

371 221, 371 226, G06F 1100, G01R 3128

Patent

active

054169194

ABSTRACT:
A semiconductor integrated circuit which includes a central processing unit, one or more peripheral circuits, one or more external terminals for transferring signals to or from the integrated circuit, and circuits for selecting the central processing unit or one of the peripheral circuits and solely operating the selected one in a test mode. The circuit for selecting includes a test mode control circuit and a signal control circuit. The test mode control circuit generates and supplies control signals in response to test operating signals having particular timings different from those of an actual operating signal inputted through the external terminal in a normal mode. The signal control circuit serves to separate the selected one from the others in a manner to allow the separated one to solely operate in the test mode.

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patent: 4989208 (1991-01-01), Akao et al.
patent: 5012180 (1991-04-01), Dalrymple et al.
patent: 5012185 (1991-04-01), Ohfuji

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