Miscellaneous active electrical nonlinear devices – circuits – and – Specific identifiable device – circuit – or system – Fusible link or intentional destruct circuit
Reexamination Certificate
2007-05-08
2007-05-08
Zweizig, Jeffrey (Department: 2816)
Miscellaneous active electrical nonlinear devices, circuits, and
Specific identifiable device, circuit, or system
Fusible link or intentional destruct circuit
Reexamination Certificate
active
11078316
ABSTRACT:
A semiconductor integrated circuit comprises an electrically programmable fuse element that is provided between a programming voltage node and a latch node, and a latch circuit that latches a voltage at the latch node. The semiconductor integrated circuit further comprises a current source that controls a magnitude of an operation current of the latch circuit, and controls a resistance determination value for determining whether the fuse element is programmed or not.
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Benjamin M. Mauck, et al., “A Design for Test Technique for Parametric Analysis of SRAM: On-Die Low Yield Analysis”, ITC International Conference, 2004, pp. 105-113.
Chiakang Sung, et al., “A 76-MHz BICMOS Programmable Logic Sequencer”, IEEE Journal of Solid-State Circuits, vol. 24, No. 5, Oct. 1989, pp. 1287-1294.
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