Semiconductor integrated circuit testing device and method

Details Semiconductor integrated circuit testing device and method Semiconductor integrated circuit testing device and method

2008-01-08

2008-01-08

Hollington, Jermele (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07317324

ABSTRACT:
A plurality of resistors is connected to a plurality of output terminals of a semiconductor integrated circuit, respectively, and a predetermined voltage is applied to the plurality of resistors. Also, a predetermined operation pattern signal used to test functions of the semiconductor integrated circuit is input to a plurality of input terminals of the semiconductor integrated circuit. Thus, a total sum of amounts of currents caused to flow through the plurality of resistors, respectively, is measured. The total sum of amounts of currents thus measured is compared with a normal value of a total sum of amounts of currents which are measured in a non-defective sample which is used instead of the semiconductor integrated circuit and is verified in advance to normally operate. It is judged based on the comparison results whether or not the semiconductor integrated circuit is normal. As a result, whether or not the semiconductor integrated circuit is a non-defective or a defective can be simply judged without performing logic simulation and failure simulation.

REFERENCES:
patent: 5451798 (1995-09-01), Tsuda et al.
patent: 5610435 (1997-03-01), Watanabe et al.
patent: 5760599 (1998-06-01), Ehiro
patent: 5904611 (1999-05-01), Takahashi et al.
patent: 5959957 (1999-09-01), Ikeda et al.
patent: 6149500 (2000-11-01), Takahashi et al.
patent: 6157200 (2000-12-01), Okayasu
patent: 6215695 (2001-04-01), Ikeda
patent: 6332835 (2001-12-01), Nishimura et al.
patent: 6492831 (2002-12-01), Hashimoto
patent: 6615152 (2003-09-01), Fujimoto et al.
patent: 6643830 (2003-11-01), Watanabe
patent: 6727723 (2004-04-01), Shimizu et al.
patent: 6750672 (2004-06-01), Tanimura et al.
patent: 6776691 (2004-08-01), Nishimura et al.
patent: 7225377 (2007-05-01), Ishida et al.
patent: 2003/0016045 (2003-01-01), Tanimura et al.

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