Semiconductor integrated circuit tester with interchangeable...

Details Semiconductor integrated circuit tester with interchangeable... Semiconductor integrated circuit tester with interchangeable...

2007-12-11

2007-12-11

Tang, Minh N. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S760020, C324S765010

Reexamination Certificate

active

11258529

ABSTRACT:
A test head for an integrated circuit tester includes a main chassis defining a chamber that is open at the top. Tester modules are installed in the chamber, each tester module being removable as a unit from the chamber and including a tester module chassis, multiple pin electronics cards, and a tester module interface structure exposed at the top of the chamber. A test head interface structure is engageable with the tester module interface structures of the tester modules for connecting the tester module interface structures to a device interface unit.

REFERENCES:
patent: 5216361 (1993-06-01), Akar et al.
patent: 6331770 (2001-12-01), Sugamori
patent: 6441630 (2002-08-01), Obikane et al.
patent: 6625557 (2003-09-01), Perkins et al.
patent: 7030642 (2006-04-01), Butsch et al.

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