Semiconductor integrated circuit, test method and electronic...

Details Semiconductor integrated circuit, test method and electronic... Semiconductor integrated circuit, test method and electronic...

2011-07-12

2011-07-12

Nguyen, Hai L (Department: 2816)

Miscellaneous active electrical nonlinear devices, circuits, and

Signal converting, shaping, or generating

Synchronizing

C327S143000

Reexamination Certificate

active

07977982

ABSTRACT:
A semiconductor integrated circuit, including: a logic section; an initiating current generating section for generating initiating current for initiating or re-initiating a circuit when the circuit is to be initiated or the circuit operates abnormally; an initiating current detecting section for detecting the initiating current of the initiating current generating section and outputting a detection signal indicating whether or not the initiating current generating section operates normally; and a signal selection section for selecting one of the detection signal and an output from the logic section based on an internal signal of the logic section which is controllable from outside of the logic section, and outputting the selected one to a terminal.

REFERENCES:
patent: 4140930 (1979-02-01), Tanaka
patent: 5109163 (1992-04-01), Benhamida
patent: 6304114 (2001-10-01), Hirakawa
patent: 6472912 (2002-10-01), Chiu et al.
patent: 7236023 (2007-06-01), Thorp et al.
patent: 7-50531 (1995-02-01), None
patent: 2000-277621 (2000-10-01), None

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